Title:
WAVELENGTH MEASURING DEVICE
Document Type and Number:
Japanese Patent JPH05296849
Kind Code:
A
Abstract:
PURPOSE:To measure the wavelength in a medium including the factor of the environmental change because the measurement accuracy of the wavelength according to the laser interference is degraded by the environmental change in a wavelength measuring apparatus. CONSTITUTION:The wavelength measuring apparatus has a U-shaped standard block 11 mounted on a stage 10 and having a reference mirror 12, and a movable part 14 to which a standard mirror 15 is set. The movable part 14 is movable along a guide groove 13 of the stage 10 from a third touching part of the standard block 11 to a first touching part. While the movable part 14 is held in touch with two touching parts of the standard block, interference fringes generated between the reflecting light from the standard mirror 15 and the reflecting light from the reference mirror 12 are measured. The wavelength in a medium is measured by the difference of two interference fringes and the moving distance of the movable part 14.
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Inventors:
YUGAWA HIROSHI
FUJIMOTO HIROHISA
EDA YUKIO
FUJIMOTO HIROHISA
EDA YUKIO
Application Number:
JP10113992A
Publication Date:
November 12, 1993
Filing Date:
April 21, 1992
Export Citation:
Assignee:
OLYMPUS OPTICAL CO
International Classes:
G01B9/02; G01J9/02; (IPC1-7): G01J9/02; G01B9/02
Attorney, Agent or Firm:
Takehiko Suzue