To stabilize the measured value, and to shorten the testing and measuring time, in a wire probe for measuring the resistance of a flat chip resistor.
This wire probe is constituted of a wire 10 with one end contacting with a measured part, a coil-like spring 12 through which the wire 10 penetrates, a cylindrical holder 13 with one end side abutting on the other end of the spring 12 through which the wire 10 penetrates, a cylinder 14 through which the wire 10 penetrates, and a stop plug 16 fixed to the other end of the wire 10, and abutting on the other end of the cylinder 14. The holder 13 is moved in the direction of the axis to compress the coil-like spring 12 by regulating the screwing-in length of the cylinder 14 with the holder 13, so as to regulate a desirable initial spring pressure, and the other end of the wire 10 is made to serve as a measured value acquiring terminal part.
Isamu Watanabe
Ryoji Kosugi
Tomohiro Mori
Tetsuya Hirosawa