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Patent Searching and Data


Title:
WIRING METHOD
Document Type and Number:
Japanese Patent JPS6146051
Kind Code:
A
Abstract:
PURPOSE:To prevent the generation of a disconnection at a stepped section and a defective contact in an opening section by forming a metallic layer onto an insulating layer with the opening section through a vapor phase growth method, leaving the metallic layer only on the inner wall surface of the opening section through anisotropic etching and shaping a conductor layer. CONSTITUTION:An aluminum layer 6 is formed onto an inter-layer insulating layer 4 including an opening section 5 through a vapor phase growth method. The aluminum layer 6 is removed with the exception of a section where there is the aluminum layer on the side wall surface of the opening section 5 by rective- ion etching the aluminum layer 6. An aluminum layer 7 is shaped onto the inter- layer insulating layer 4 including the opening section 5 through sputtering evaporation. A second layer wiring layer is formed by photoetching the aluminum layer 7. According to such a wiring method, aluminum 6 can be positioned positivvely on the inner wall surface of the opening section 5 in the inter-layer insulating layer 4, thus obtaining a contact section 8, in which there is no disconnection at a stepped section and which has small resisitivity.

Inventors:
NISHIHARA TOSHIYUKI
Application Number:
JP16765784A
Publication Date:
March 06, 1986
Filing Date:
August 10, 1984
Export Citation:
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Assignee:
SONY CORP
International Classes:
H01L21/3213; H01L21/28; H01L21/768; (IPC1-7): H01L21/28; H01L21/88
Domestic Patent References:
JPS5923544A1984-02-07
JPS5999718A1984-06-08
JPS6024050A1985-02-06
Attorney, Agent or Firm:
Yuji Komatsu