Title:
計測用Ｘ線ＣＴ装置
Document Type and Number:
Japanese Patent JP7286485
Kind Code:
B2
Abstract:
A measurement X-ray CT apparatus calibrates a geometrical positional relationship between a focus of an X-ray source, an X-ray detector, and a rotation center of a rotating table in advance. The measurement X-ray CT apparatus then obtains projection images by irradiating the object to be measured with X-rays to perform a CT scan, and generates a three-dimensional image of the object to be measured by CT reconstruction of the projection images. The measurement X-ray CT apparatus further includes a reference frame that is made of a material and has a structure less susceptible to environmental changes, and sensors that are located on the reference frame and intended to successively obtain calibration values of the geometrical positional relationship between the focus of the X-ray source and the X-ray detector during the CT scan. The calibration values are used as parameters of the CT reconstruction.
Inventors:
Seiji Sasaki
Nobuyuki Nakazawa
Sakai Hisayoshi
Now Masato
Hidemitsu Asano
Nobuyuki Nakazawa
Sakai Hisayoshi
Now Masato
Hidemitsu Asano
Application Number:
JP2019163422A
Publication Date:
June 05, 2023
Filing Date:
September 06, 2019
Export Citation:
Assignee:
Mitutoyo Corporation
International Classes:
G01N23/046; G01B15/00
Domestic Patent References:
| JP2012112790A | ||||
| JP2007309687A | ||||
| JP2017223468A | ||||
| JP2007139613A | ||||
| JP2017205333A | ||||
| JP2015215218A | ||||
| JP2005127805A |
Foreign References:
| US20150260859 |
Attorney, Agent or Firm:
Patent Attorney Corporation MTS International Patent Office