Title:
An X ray analysis method and an X ray imaging apparatus
Document Type and Number:
Japanese Patent JP6038278
Kind Code:
B2
Inventors:
Akio Yoneyama
Application Number:
JP2015502614A
Publication Date:
December 07, 2016
Filing Date:
February 27, 2013
Export Citation:
Assignee:
株式会社日立製作所
International Classes:
G01N23/20
Domestic Patent References:
JP2003090807A | 2003-03-28 | |||
JP2002107312A | 2002-04-10 | |||
JP2004077155A | 2004-03-11 | |||
JP2008026098A | 2008-02-07 | |||
JP2010172564A | 2010-08-12 | |||
JP2010172566A | 2010-08-12 | |||
JP2012037352A | 2012-02-23 | |||
JP2005152500A | 2005-06-16 | |||
JP2003090807A | 2003-03-28 | |||
JP2002107312A | 2002-04-10 | |||
JP2004077155A | 2004-03-11 | |||
JP2008026098A | 2008-02-07 | |||
JP2010172564A | 2010-08-12 | |||
JP2010172566A | 2010-08-12 | |||
JP2012037352A | 2012-02-23 | |||
JP2005152500A | 2005-06-16 |
Attorney, Agent or Firm:
Manabu Inoue
Yuji Toda
Shigemi Iwasaki
Yuji Toda
Shigemi Iwasaki