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Title:
An X ray analysis method and an X ray imaging apparatus
Document Type and Number:
Japanese Patent JP6038278
Kind Code:
B2
Inventors:
Akio Yoneyama
Application Number:
JP2015502614A
Publication Date:
December 07, 2016
Filing Date:
February 27, 2013
Export Citation:
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Assignee:
株式会社日立製作所
International Classes:
G01N23/20
Domestic Patent References:
JP2003090807A2003-03-28
JP2002107312A2002-04-10
JP2004077155A2004-03-11
JP2008026098A2008-02-07
JP2010172564A2010-08-12
JP2010172566A2010-08-12
JP2012037352A2012-02-23
JP2005152500A2005-06-16
JP2003090807A2003-03-28
JP2002107312A2002-04-10
JP2004077155A2004-03-11
JP2008026098A2008-02-07
JP2010172564A2010-08-12
JP2010172566A2010-08-12
JP2012037352A2012-02-23
JP2005152500A2005-06-16
Attorney, Agent or Firm:
Manabu Inoue
Yuji Toda
Shigemi Iwasaki



 
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