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Title:
X-RAY DETECTING METHOD FOR REFERENCE MARK OF MULTILAYER LAMINATED BOARD
Document Type and Number:
Japanese Patent JP2002252471
Kind Code:
A
Abstract:

To allow the center of a reference mark to be detected soon after the reference mark is selected using a template.

A preparation stage comprises a step where a multilayer wiring board is irradiated with an X-ray to image a reference mark, a step where a prescribed reference mark is extracted from a picked-up image together with a surrounding identifying image to generate the template, a step where an image of the reference mark of the template is extracted to measure a center position, a step where data of the center position is set to the template, and a step where an image of the template and the center position data are registered. A detection stage comprises a step where the multilayer wiring board is irradiated with the X-ray to image the reference mark, a step where the picked-up image is scanned with the template for a pattern matching process, a step where the center position of the image of the reference mark is detected based on the center position data registered in the template, and a step to output the data.


Inventors:
ISHIGURO HIROYUKI
Application Number:
JP2001050998A
Publication Date:
September 06, 2002
Filing Date:
February 26, 2001
Export Citation:
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Assignee:
MATSUSHITA ELECTRIC WORKS LTD
International Classes:
G01B15/00; G01N23/04; G06T1/00; G06T7/00; H05K3/46; (IPC1-7): H05K3/46; G01B15/00; G01N23/04; G06T1/00; G06T7/00
Attorney, Agent or Firm:
Keisei Nishikawa (1 person outside)