Title:
X線画像診断装置
Document Type and Number:
Japanese Patent JP4723767
Kind Code:
B2
Abstract:
PROBLEM TO BE SOLVED: To provide an X-ray diagnostic device which can extract time- dependent noise more accurately and reduce the influence of random noise to 1/√2 by extracting the time-dependent noise by using pixels for correction turned ON at the same time. SOLUTION: A weighted means value is calculated by an extracting method for time-dependent noise and more accurate extraction of the time-dependent noise is carried out. An X-ray plane detector which can make a read from two directions extracts the time-dependent noise by subtracting an offset image from an original image by using pixels for correction turned ON at the same time. Thus, the influence of the random noise is reducible to 1/√2.
Inventors:
Takayuki Tomisaki
Application Number:
JP2001278013A
Publication Date:
July 13, 2011
Filing Date:
September 13, 2001
Export Citation:
Assignee:
Toshiba Corporation
International Classes:
G01T1/00; A61B6/00; H04N5/32; G01T1/24; G01T7/00; H01L27/14; H01L27/146; H01L31/09; H04N5/335; H04N5/347; H04N5/357; H04N5/369; H04N5/374
Domestic Patent References:
| JP2001056382A | ||||
| JP63169882A | ||||
| JP2164184A | ||||
| JP2001099944A | ||||
| JP9147103A | ||||
| JP2002101343A |
Attorney, Agent or Firm:
Hiroaki Sakai
Nakamura Tomoyuki
Nakamura Tomoyuki