Title:
An X ray energy-spectrum measuring method, an X ray energy-spectrum measuring device, and an X-ray CT scanner
Document Type and Number:
Japanese Patent JP6133231
Kind Code:
B2
Abstract:
Provided is an X-ray energy spectrum estimation method capable of reproducing, with high precision, information on an attenuation path to which an X-ray is irradiated, and performing, with high precision, reconstruction of an X-ray CT image by enabling high-precision estimation of spectrum of energy released from an X-ray source device 10. An energy spectrum estimation device 92 normalizes a response function, and calculates a modified efficiency matrix from the normalized response function, a detection efficiency matrix, and a measurement-system correction coefficient. The energy spectrum estimation device 92 then calculates a particular result in accordance with a Bayesian estimation equation, without divergence, with use of the calculated modified efficiency matrix, the normalized modified efficiency matrix, and an attenuation characteristic curve obtained by a measurement circuit 30. The energy spectrum estimation device 92 calculates an X-ray energy spectrum by dividing, by the normalized modified efficiency matrix, the particular result obtained by the Bayesian estimation equation.
Inventors:
Hiroyuki Takagi
Isao Murata
Isao Murata
Application Number:
JP2014086712A
Publication Date:
May 24, 2017
Filing Date:
April 18, 2014
Export Citation:
Assignee:
株式会社日立製作所
International Classes:
A61B6/03
Domestic Patent References:
| JP2002528216A | ||||
| JP2003175026A |
Foreign References:
| US20120281810 |
Attorney, Agent or Firm:
Kaichi International Patent Office
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