Title:
Ｘ線透視方法およびＸ線透視装置
Document Type and Number:
Japanese Patent JP7334590
Kind Code:
B2
Abstract:
To provide an X-ray fluoroscopic method and X-ray fluoroscopic apparatus which can correctly recognize the position of an end edge of a linear marker.SOLUTION: An X-ray fluoroscopic method that uses two X-ray imaging systems including X-ray irradiation units and X-ray detection units and specifies the position of an end edge of a linear marker by collecting from different two directions the X-ray image including the marker detained in the body of a subject to detect the position of the marker that moves following the body motion of the subject comprises: a determination step of determining whether or not the position of one end edge of the marker on a pair of projection surfaces matches epipolar restriction when setting epipolar geometry with the focal point of each X-ray irradiation unit as the projection center of a camera, and an image detected by each X-ray detection unit viewed from the focal point of each X-ray irradiation unit as the projection surface of the camera; and a change step of changing the position of the other end edge of the marker on one projection surface to the position of the one end edge when the position of the one end edge of the marker on the pair of projection surfaces does not match the epipolar restriction.SELECTED DRAWING: Figure 8
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Inventors:
Seiji Yamanaka
Application Number:
JP2019210146A
Publication Date:
August 29, 2023
Filing Date:
November 21, 2019
Export Citation:
Assignee:
SHIMADZU CORPORATION
International Classes:
A61B6/00; A61B6/12
Domestic Patent References:
| JP2017029649A | ||||
| JP2015066275A | ||||
| JP2007526066A |
Foreign References:
| US5699446 |
Attorney, Agent or Firm:
Patent Attorney Corporation Kyoto International Patent Office
Takashi Ohtsubo
Takashi Ohtsubo