Title:
X-ray generator
Document Type and Number:
Japanese Patent JP6114981
Kind Code:
B2
Abstract:
The X-ray generating apparatus 100 applies an electron beam e1 onto a target 150 to generate X-rays x1, and includes a permanent magnet lens 120 configured to focus the electron beam e1, a correction coil 130 provided on a side of the electron beam e1 with respect to the permanent magnet lens 120 and configured to correct a focus position formed by the permanent magnet lens 120 in a traveling direction of the electron beam e1, and a target 150 onto which the focused electron beam is applied. Accordingly, the apparatus configuration can be extremely compact and lightweight in comparison with general apparatuses. Furthermore, by the correction coil 130, the intensity of the magnetic field can be finely adjusted and the focus position in the traveling direction of the electron beam e1 can be finely adjusted.
Inventors:
Martin Holvers
Gili Marsick
Ladis Love Pina
Baklav jernic
Naohisa Osaka
Kazuhiko Omote
Kobe Ryo
Resai Jean
Bon Lee Kim
Gili Marsick
Ladis Love Pina
Baklav jernic
Naohisa Osaka
Kazuhiko Omote
Kobe Ryo
Resai Jean
Bon Lee Kim
Application Number:
JP2012230115A
Publication Date:
April 19, 2017
Filing Date:
October 17, 2012
Export Citation:
Assignee:
Rigaku Corporation
International Classes:
H01J35/14; H01J35/08
Domestic Patent References:
| JP2008535183A | ||||
| JP58145049A | ||||
| JP5502330A | ||||
| JP2011233365A | ||||
| JP2009212058A | ||||
| JP2001351552A | ||||
| JP2002540581A |
Attorney, Agent or Firm:
Takeo Fukuchi
Yoichi Shirakawa
Yoichi Shirakawa
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