Title:
Ｘ線撮像の方法およびそのシステム
Document Type and Number:
Japanese Patent JP7271496
Kind Code:
B2
Abstract:
An X-ray imaging method includes the following steps: (a) performing a first object imaging and obtaining a first object intensity signal by detecting an X-ray passing through a first object; (b) performing baseline imaging process, obtaining a baseline intensity signal by detecting the X-ray when the first object is not in a FOV; and; (c) obtaining the first thickness of the first object by performing operations on the first object intensity signal, the baseline intensity signal, and the first attenuation coefficient of the first object.
Inventors:
陳 思▲ユー▼
Lee Chi Hyun
Lee Chi Hyun
Application Number:
JP2020205759A
Publication Date:
May 11, 2023
Filing Date:
December 11, 2020
Export Citation:
Assignee:
DELTA ELECTRONICS,INC.
International Classes:
G01B15/02; G01G9/00; G01N23/04; G01N23/083
Domestic Patent References:
| JP2010249691A | ||||
| JP2013130392A | ||||
| JP2016524702A |
Foreign References:
| US20030072409 |
Attorney, Agent or Firm:
Patent Attorney Corporation Cosmos International Patent and Trademark Office