Title:
X線イメージング・センサおよびX線イメージング法
Document Type and Number:
Japanese Patent JP2009540282
Kind Code:
A
Abstract:
The invention concerns an x-ray imaging sensor and an x-ray imaging method in which, in a scintillator element (11, 21) or in an element having a corresponding functionality, x-ray quanta are converted into photons having a wavelength substantially greater than the wavelength range of the x-ray quanta. The information detected in the scintillator element (11, 12) is converted to pixel-specific electric signals in a semiconductor element (13, 23), which includes photodiodes (15, 25, 35) or corresponding means that are arranged to divide at least part of the area of the sensor to pixels (14, 24, 34). Arranged in functional connection with the pixel-specific photodiodes (25, 35) or corresponding means, there has been arranged means comprising an I/F (current to frequency) converter (26, 36) or a corresponding component for quantizing the electric signals by converting them to pixel-specific frequencies, i.e. pulse trains.
Inventors:
De Godozinski, Christian
Application Number:
JP2009513720A
Publication Date:
November 19, 2009
Filing Date:
June 05, 2007
Export Citation:
Assignee:
Planmeca Oy
International Classes:
G01T1/20; A61B6/00; H01L27/14; H04N25/30
Domestic Patent References:
| JP2003527610A | 2003-09-16 | |||
| JP2003510616A | 2003-03-18 | |||
| JP2004513700A | 2004-05-13 | |||
| JP2005172822A | 2005-06-30 | |||
| JP2003329777A | 2003-11-19 | |||
| JPH1164939A | 1999-03-05 |
Attorney, Agent or Firm:
Masao Okabe
Nobuaki Kato
Okabe
Shinichi Usui
Takao Ochi
Asahi Shinmitsu
Katsumi Miyama
Nobuaki Kato
Okabe
Shinichi Usui
Takao Ochi
Asahi Shinmitsu
Katsumi Miyama