To provide an X-ray inspection device and an X-ray inspection method capable of performing X-ray inspection in a shorter period of time than in a CT image by clearly distinguishing an image of an inspection object in a two-dimensional X-ray transmission image from a background to improve visibility.
An X-ray inspection device 1 having at least an X-ray source 12 and a detector 14 to detect an inspection object 101 in a sample 100 has image acquisition means 60 for acquiring a two-dimensional transmission image of the inspection object, shift image generation means 60 for generating a shift image obtained by shifting the X-ray transmission image by one pixel or more at least in one direction of two-dimensional directions, differential image generation means 60 for differentiating the X-ray transmission image and the shift image to generate a differential image for highlighting the inspection object, and image display means 69 for displaying the differential image.
SHIRAKAWABE YOSHIHARU
UMEKI TAKESHI
| JP2009236636A | 2009-10-15 | |||
| JPH10253337A | 1998-09-25 | |||
| JP2005058315A | 2005-03-10 | |||
| JP2008256603A | 2008-10-23 | |||
| JP2008309646A | 2008-12-25 | |||
| JPH0896127A | 1996-04-12 |
| WO2011066012A1 | 2011-06-03 | |||
| US20100060633A1 | 2010-03-11 |
Akira Shimoda
Kazuhiko Kurihara