Title:
X-RAY INSPECTION DEVICE
Document Type and Number:
Japanese Patent JP2016217913
Kind Code:
A
Abstract:
PROBLEM TO BE SOLVED: To provide an X-ray inspection device that almost correctly extracts a contour of spherical foreign matters even when a material of an analyte or thickness thereof is not even, and luminance of a part of a foreign matter image on an X-ray fluoroscopic image is differently displayed.SOLUTION: After extracting a contour of a foreign matter on the basis of luminance information about pixels on an X-ray fluoroscopic image of an analyte, an X-ray inspection device is configured to: sample a plurality of points at a fixed interval on the contour; implement an operation obtaining a circle passing a prescribed number of consecutive three or more sampling points as shifting the sampling point one by one; obtain the number of times of passing in the vicinity of the sampling point other than points used in obtaining the circle as to the obtained circle; and determine the circle maximum in the number of times as a contour of a foreign matter image. Accordingly, even when the contour of the foreign image extracted by binarization and the like is in a state where a part of an analyte is missed arising from a structure of the analyte, a missing part is modified to enable an acquisition of more correct dimension information on the foreign matter.SELECTED DRAWING: Figure 2
Inventors:
TATEZAWA YOSHIHIRO
Application Number:
JP2015103837A
Publication Date:
December 22, 2016
Filing Date:
May 21, 2015
Export Citation:
Assignee:
SHIMADZU CORP
International Classes:
G01N23/18; G01N23/04
Attorney, Agent or Firm:
Yoshio Kashima
Previous Patent: Oven for chromatographs, and a chromatograph using it
Next Patent: Gel for sensors, and a sensor
Next Patent: Gel for sensors, and a sensor