Title:
Ｘ線検査装置
Document Type and Number:
Japanese Patent JP6859276
Kind Code:
B2
Abstract:
To provide an X-ray inspection device that can suppress a leakage of an unwanted X-ray even if an inspected item not matching a shape of a passage part is conveyed.SOLUTION: An X-ray inspection device comprises: a touch panel type display unit 8 that displays a plurality of keys and the like, and causes a setting input of a various kinds of parameters and the like or a selection of an action mode with respect to a control unit 40 to be conducted; a camera 7 that is arranged so as to detect a height direction of an inspected item W; a shape inspection unit 45 that compares an image of a reference inspection article corresponding to a kind of the preliminarily stored inspected item W with an image of the inspected item W captured by the camera 7 to determine whether a shape of the inspected item W adapts to a shape of a passage part; and the control unit 40 that, when the shape inspection unit 45 determines that the shape of the inspected item W does not adapt to the shape of the passage part, controls an amount of X-ray irradiation to less than a prescribed amount thereof.SELECTED DRAWING: Figure 5
Inventors:
Takeshi Tsunoda
Application Number:
JP2018001917A
Publication Date:
April 14, 2021
Filing Date:
January 10, 2018
Export Citation:
Assignee:
Anritsu Fibis Co., Ltd.
International Classes:
G01N23/10
Domestic Patent References:
| JP3190710U | ||||
| JP2004029040A | ||||
| JP2006098195A | ||||
| JP2006071514A |
Foreign References:
| US20070215821 |
Attorney, Agent or Firm:
Nissei International Patent Office