Title:
X-RAY THICKNESS GAUGE
Document Type and Number:
Japanese Patent JP2023117780
Kind Code:
A
Abstract:
To provide an X-ray thickness gauge that can extend the use life of an X-ray generator.SOLUTION: An X-ray thickness gauge comprises: an X-ray generator; a detector that detects an X-ray generated from the X-ray generator and transmitting through a plate to be measured; a storage device that stores a calibration curve table representing a relation between a thickness of the plate to be measured and a detection signal for every material of the plate to be measured acquired in advance; an operation unit that converts the detection signal during measurement into the thickness of the plate to be measured based on the calibration curve table; and a determination unit that, based on information on deterioration of the X-ray generator, performs determination to reduce a tube voltage of the X-ray generator from a first tube voltage set according to a measurement plate thickness range to a second tube voltage lower than the first tube voltage. The calibration curve table includes a calibration curve table at the first tube voltage and a calibration curve table at the second tube voltage. When the determination unit performs determination to reduce the tube voltage to the second tube voltage, the X-ray generator is operated at the second tube voltage.SELECTED DRAWING: Figure 1
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Inventors:
GOYA YOSHINORI
Application Number:
JP2022020527A
Publication Date:
August 24, 2023
Filing Date:
February 14, 2022
Export Citation:
Assignee:
TOSHIBA CORP
TOSHIBA INFRASTRUCTURE SYSTEMS & SOLUTIONS CORP
TOSHIBA INFRASTRUCTURE SYSTEMS & SOLUTIONS CORP
International Classes:
G01B15/02
Attorney, Agent or Firm:
Patent Attorney Firm iX