Title:
X-RAY THICKNESS METER
Document Type and Number:
Japanese Patent JP2023137306
Kind Code:
A
Abstract:
To provide an X-ray thickness meter which can predict an abnormality of a correction operation using a reference plate.SOLUTION: The operation time when a reference plate is moved from a removal position to an insertion position and is returned from the insertion position to the removal position, and the voltage, the current, and the temperature of a rotary solenoid at this time are stored in a storage device as comparison data. A monitor device compares at least one of the voltage, the current, and the temperature of the rotary solenoid at the time of correction with comparison data, thereby notifying an abnormality of the correction operation, when the operation time at the time of correction is changed from in the comparison data by a predetermined time.SELECTED DRAWING: Figure 2
Inventors:
KAWASHIMA YUKI
Application Number:
JP2022043447A
Publication Date:
September 29, 2023
Filing Date:
March 18, 2022
Export Citation:
Assignee:
TOSHIBA CORP
TOSHIBA INFRASTRUCTURE SYSTEMS & SOLUTIONS CORP
TOSHIBA INFRASTRUCTURE SYSTEMS & SOLUTIONS CORP
International Classes:
G01B15/02
Attorney, Agent or Firm:
Patent Attorney Firm iX