Title:
異常判定装置、異常判定プログラムおよび異常判定方法
Document Type and Number:
Japanese Patent JP5598082
Kind Code:
B2
Abstract:
PROBLEM TO BE SOLVED: To provide an anomaly analysis device to determine the type of anomalies based on inputted data.SOLUTION: A training data input unit 101 receives input of training data and pre-defined parameters from the outside of the anomaly analysis device. A parameter estimation unit 102 estimates parameters for a linear combination model, based on the inputted training data. An evaluation data input unit 103 estimates parameters for a linear regression analysis model, based on the inputted evaluation data. An inter-series anomaly detection unit 104 detects whether or not an inter-series anomaly has been caused based on the estimated parameters for the linear combination model and the linear regression analysis model. An intra-series anomaly detection unit 105 detects whether or not an intra-series anomaly has been caused based on the estimated parameters for the linear combination model and the linear regression analysis model.
Inventors:
Kenji Aoki
Application Number:
JP2010113426A
Publication Date:
October 01, 2014
Filing Date:
May 17, 2010
Export Citation:
Assignee:
NEC Corp.
International Classes:
G05B23/02; G06F11/34; G06N3/00
Attorney, Agent or Firm:
Rock face Fuyuki
Shiokawa Masato
Shiokawa Masato