Title:
ANALYSIS METHOD AND ANALYZER
Document Type and Number:
Japanese Patent JP2017207289
Kind Code:
A
Abstract:
PROBLEM TO BE SOLVED: To provide an analysis method with which it is possible to extract a particulate detection signal with higher accuracy than conventionally possible and detect a particulate on the basis of the extracted particulate detection signal, thereby indirectly increasing the accuracy of detecting a detection object substance.SOLUTION: A substrate 1 for analysis having a reaction area 10 where a detection object substance 11 and a particulate 20 that is a metal compound for labeling the detection object substance 11 are captured and formed with a resin material is irradiated with a laser beam (step S2). A signal level generated by receiving reflected light from the substrate 1 for analysis is extracted as a reference signal level DL (step S4). Reflected light from the reaction area 10 is received and a received light level signal JS is generated (step S6). A received light level signal JS having a higher signal level than the received light level of reflected light from the substrate 1 for analysis in the reaction area 10 is extracted as a particulate detection signal KS (step S7). A particulate 20 is detected on the basis of the extracted particulate detection signal KS (step S8).SELECTED DRAWING: Figure 5
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Inventors:
ONO MASAYUKI
ITONAGA MAKOTO
HASEGAWA YUICHI
TSUJITA KOJI
IWAMA SHIGEHIKO
ITONAGA MAKOTO
HASEGAWA YUICHI
TSUJITA KOJI
IWAMA SHIGEHIKO
Application Number:
JP2016097830A
Publication Date:
November 24, 2017
Filing Date:
May 16, 2016
Export Citation:
Assignee:
JVC KENWOOD CORP
International Classes:
G01N33/543; G01N33/553
Domestic Patent References:
| JP2013134083A | 2013-07-08 | |||
| JP2009115665A | 2009-05-28 |
Foreign References:
| WO2016052118A1 | 2016-04-07 | |||
| US6025202A | 2000-02-15 | |||
| US5922537A | 1999-07-13 |
Attorney, Agent or Firm:
Hidekazu Miyoshi
Shunichi Takahashi
Shunichi Takahashi