Title:
質量スペクトルと略同時に吸収・発光・散乱スペクトルを分析する分析装置および分析方法、並びに、エレクトロスプレーイオン化法を用いた質量分析装置および分析方法
Document Type and Number:
Japanese Patent JPWO2005083416
Kind Code:
A
Inventors:
小江 Seiji
Yoshito Watanabe
Toshikazu Fukuzumi
Yoshito Watanabe
Toshikazu Fukuzumi
Application Number:
JP2005002934W
Publication Date:
September 09, 2005
Filing Date:
February 23, 2005
Export Citation:
Assignee:
Independent administrative institution Japan Science and Technology Agency
International Classes:
G01N21/33; G01N27/62; G01N21/27; G01N21/35; G01N21/64; H01J49/10; H01J49/06; G01N21/65
Attorney, Agent or Firm:
Patent business corporation Hara [Kenzo] international patent firm