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Title:
A conditioning method and a device of a polishing pad
Document Type and Number:
Japanese Patent JP6041967
Kind Code:
B2
Abstract:
A method of and an apparatus for conditioning a surface of a polishing pad 2 is used for conditioning a polishing pad on a polishing table 1 for polishing a thin film formed on a surface of a substrate W . The conditioning method includes bringing a dresser 22 into contact with the polishing pad, and conditioning the polishing pad by moving the dresser between a central part of the polishing pad and an outer circumferential part of the polishing pad. A moving speed of the dresser at a predetermined area of the polishing pad is controlled by a controller 40 to be higher than a standard moving speed of the dresser at the predetermined area of the polishing pad.

Inventors:
Mutsumi Tanikawa
Takahiro Shimano
Application Number:
JP2015234518A
Publication Date:
December 14, 2016
Filing Date:
December 01, 2015
Export Citation:
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Assignee:
Ebara Corporation
International Classes:
B24B37/00; B24B53/02; H01L21/304
Domestic Patent References:
JP2010076049A
JP2002200552A
JP2005125444A
JP10000550A
Foreign References:
US20100081361
US5984764
Attorney, Agent or Firm:
Isamu Watanabe
Tetsuya Hirosawa



 
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