Title:
A defect inspection system and a manufacture device of a film
Document Type and Number:
Japanese Patent JP6182806
Kind Code:
B2
Abstract:
This defect inspection system includes: lamination rolls for laminating a first film and a second film to form a film; a transport line to the downstream side from the lamination rolls, for transporting the film; a defect inspection apparatus situated on the transport line; and a recording apparatus situated on the transport line to the downstream side from the defect inspection apparatus, for recording onto the film defect information relating to defects detected by the defect inspection apparatus. The defect inspection apparatus is located on the transport line to the upstream side from the roll that, apart from the lamination rolls, initially contacts the second film on the surface on the opposite side from the first film.
Inventors:
Keita Imura
Application Number:
JP2013117947A
Publication Date:
August 23, 2017
Filing Date:
June 04, 2013
Export Citation:
Assignee:
Sumitomo Chemical Co., Ltd.
International Classes:
G01N21/892; G01B11/30
Domestic Patent References:
| JP2009243911A | ||||
| JP2004286526A | ||||
| JP2013007689A | ||||
| JP201185629A | ||||
| JP200562165A |
Foreign References:
| WO2011148790A1 | ||||
| US20100162865 |
Attorney, Agent or Firm:
Sumio Tanai
Naozumi Hiroyasu
Norihiko Ara
Hiroyuki Kato
Mitsunaga Igarashi
Naozumi Hiroyasu
Norihiko Ara
Hiroyuki Kato
Mitsunaga Igarashi