A degradation estimating device and a degradation estimation method for the same of a malfunction detection device of an internal resistance arithmetic unit of a rechargeable battery, an internal resistance arithmetic method for the same, and a rechargeable battery, an abnormality detecting method for the same, and a rechargeable battery

Title:

Document Type and Number:

Japanese Patent JP6026120

Kind Code:

B2

Abstract:

PROBLEM TO BE SOLVED: To provide an internal resistance calculation apparatus for secondary batteries capable of improving calculation accuracy of an internal resistance value.SOLUTION: An internal resistance calculation apparatus 10 for secondary batteries includes: a voltage measuring unit 3 that is connected between a positive electrode terminal and a negative electrode terminal of each battery cell 1 constituting a secondary battery and measures an interterminal voltage; a current measuring unit 4 that is inserted into a current route and measures charge/discharge currents with respect to the battery cell 1; a control unit 6 that controls measurements in the voltage measuring unit 3 and the current measuring unit 4; and an arithmetic unit 8 that is connected to the control unit 6, performs wavelet transformation from each measurement value of the voltage measuring unit 3 and the current measuring unit 4, obtains wavelet coefficients of the current and the voltage for every frequency and calculates the internal resistance of the secondary battery from a ratio thereof.

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Inventors:

Koji Sakata
Takashi Morimoto
Masahiro Tobara
Asami Mizutani

Application Number:

JP2012062578A

Publication Date:

November 16, 2016

Filing Date:

March 19, 2012

Export Citation:

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Assignee:

Toshiba Corporation

International Classes:

G01R31/36; G01R27/02; H01M10/42; H01M10/48; H02J7/00

Domestic Patent References:

JP2005221487A
JP2004165058A
JP2006098135A
JP2000131404A
JP2006204069A
JP2003330910A

Attorney, Agent or Firm:

Kiuchi Mitsuharu

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