Title:
プロセスに対して寛容性のある集積回路の設計手法
Document Type and Number:
Japanese Patent JP4043683
Kind Code:
B2
Abstract:
An operating parameter of an integrated circuit is made substantially insensitive to process variations by configuring the circuit such that an environmental parameter, e.g., supply voltage to a portion of the circuit, is made a function of one or more process parameters, e.g., conduction threshold voltages and mobilities in that portion of the circuit. In this manner, the effect of the process parameters on the circuit operating parameter may be partially or substantially offset by the effect of the environmental parameter on the process parameters. In an illustrative embodiment, the circuit operating parameter is an oscillation period of a ring oscillator. A voltage regulator generates a reference voltage which is determined at least in part based on known process parameter variations in the ring oscillator. The ring oscillator utilizes the reference voltage generated by the voltage regulator as its supply voltage, and its oscillation period is thereby made insensitive to the process parameter variations. In addition, back-bias effects may be introduced in the voltage regulator to compensate back-bias effects resulting from particular configurations of the ring oscillator. The design techniques of the invention may be applied to a wide variety of different types of integrated circuits, operating parameters, environmental parameters and process parameters.
Inventors:
Masaka Shoji
Application Number:
JP2000062872A
Publication Date:
February 06, 2008
Filing Date:
March 08, 2000
Export Citation:
Assignee:
Lucent Technologies, Inc.
International Classes:
H01L21/822; H01L27/04; H03K3/011; H03K3/03; H03L1/00; H03L7/099
Domestic Patent References:
| JP10065533A |
Attorney, Agent or Firm:
Masao Okabe
Nobuaki Kato
Shinichi Usui
Takao Ochi
Asahi Shinmitsu
Nobuaki Kato
Shinichi Usui
Takao Ochi
Asahi Shinmitsu