Title:
A detecting device, an inspection device, an inspection method, and a program
Document Type and Number:
Japanese Patent JP5999406
Kind Code:
B2
Abstract:
PROBLEM TO BE SOLVED: To detect abnormality in an installation state of a current sensor without using the measured result of voltage.SOLUTION: An inter-phase determining value is calculated by integrating a multiplication value of an instantaneous value of a PV current measured by a current sensor installed in a power generation system and an instantaneous value of a trunk current value measured by the current sensor installed in a trunk system for one cycle. When a measurement type is set to PV existence (branch) and then when the inter-phase phase determining value of any phase is determined as larger than 0 in a step S93, an installation state of the current sensor is determined as abnormal and error indication is made. The present invention is applicable to, for example, an electric power monitoring system for monitoring electric power in a household.
Inventors:
Yuko Imazato
Takashi Nishimura
Takaaki Ishii
Takashi Nishimura
Takaaki Ishii
Application Number:
JP2012000967A
Publication Date:
September 28, 2016
Filing Date:
January 06, 2012
Export Citation:
Assignee:
OMRON Corporation
International Classes:
G01R31/02; G01R22/06
Domestic Patent References:
| JP5850234B2 | ||||
| JP2011160562A | ||||
| JP5333874B2 | ||||
| JP5773191B2 | ||||
| JP5880915B2 | ||||
| JP2002199588A | ||||
| JP2002286785A | ||||
| JP2008236897A | ||||
| JP2006329941A |
Foreign References:
| WO2011093109A1 | ||||
| US20050001486 |
Attorney, Agent or Firm:
Yoshio Inamoto
Takashi Nishikawa
Takashi Nishikawa
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