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Title:
配光パターン中心の検出方法
Document Type and Number:
Japanese Patent JP5042581
Kind Code:
B2
Abstract:

To provide a method capable of accurately and simply detecting the center (elbow point) of a light distribution pattern having a horizontal cut line and an oblique cut line.

An imaging device 113 with the first light receiving domain A1 and the second light receiving domain A2 arranged oppositely in the vertical direction across an upper-lower middle domain A3 is used, and the light distribution pattern LBP is received, while changing the position of the imaging device 113 in the vertical direction, and a middle point in a range when a light receiving ratio between each light receiving amount detected in the first light receiving domain A1 and the second light receiving domain A2 becomes an extreme value is detected as a position in the vertical direction of the horizontal cut line HC. Even when a wavy part HW caused by cut dimness is generated on the horizontal cut line HC, the wavy part HW is removed, and the horizontal cut line HC and the elbow point EP positioned above it can be detected with high accuracy.

COPYRIGHT: (C)2008,JPO&INPIT


Inventors:
Masao Okawa
Application Number:
JP2006273538A
Publication Date:
October 03, 2012
Filing Date:
October 05, 2006
Export Citation:
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Assignee:
Koito Manufacturing Co., Ltd.
International Classes:
G01M11/06; F21S8/10; F21V14/00; F21W101/10; F21Y101/00
Domestic Patent References:
JP4025741A
JP2007190986A
JP60008730A
JP59214731A
Attorney, Agent or Firm:
Akio Suzuki



 
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