Title:
検出回路
Document Type and Number:
Japanese Patent JP7347355
Kind Code:
B2
Abstract:
To provide a detection circuit that can improve the accuracy of overheat protection.SOLUTION: A detection circuit of the present disclosure has a temperature detection circuit that detects the temperature of a semiconductor device, a current detection circuit that detects the current flowing in the semiconductor device, and an overheat detection circuit that determines whether the semiconductor device is in an overheat state based on the voltage obtained by adding at least the voltage corresponding to the current to the voltage corresponding to the temperature.SELECTED DRAWING: Figure 1
Inventors:
Kazushi Oki
Takahito Yamashita
Takahito Yamashita
Application Number:
JP2020122747A
Publication Date:
September 20, 2023
Filing Date:
July 17, 2020
Export Citation:
Assignee:
Mitsubishi Electric Corporation
International Classes:
H03K17/08; H02M1/00; H03K17/567
Domestic Patent References:
| JP2009158540A | ||||
| JP2020099147A | ||||
| JP2019122107A | ||||
| JP2012039460A |
Foreign References:
| WO2020032213A1 | ||||
| CN109994993A |
Attorney, Agent or Firm:
Mamoru Takada
Hideki Takahashi
Yoshimi Kuno
Hideki Takahashi
Yoshimi Kuno
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