Login| Sign Up| Help| Contact|

Patent Searching and Data


Title:
平均自由行程を測定する装置、真空計、および平均自由行程を測定する方法
Document Type and Number:
Japanese Patent JPWO2011033933
Kind Code:
A
Inventors:
Yoshiro Shiokawa
Nakamura Blessing
彭 Strength
Application Number:
JP2010064917W
Publication Date:
February 14, 2013
Filing Date:
September 01, 2010
Export Citation:
Click for automatic bibliography generation   Help
Assignee:
Canon ANELVA Corporation
International Classes:
G01L21/32
Attorney, Agent or Firm:
岡部 讓
吉澤 弘司
三山 勝巳
川崎 孝