Title:
An exhaust air sampling system and a method for synchronizing time alignment and time delay
Document Type and Number:
Japanese Patent JP6154463
Kind Code:
B2
Abstract:
A system and method is provided for synchronizing a first and second signal of an exhaust sampling system. The first signal is generated by a first instrument and includes an exhaust flow rate component and a first instrument time stamp component. The second signal is generated by a second instrument and includes a pollutant concentration component and a second instrument time stamp component. The second instrument also generates a tertiary signal that has been influenced by the first signal and includes a second instrument time stamp component. A synchronization module determines a time relationship for synchronizing the first signal and the second signal by comparing the first flow rate component and the first instrument time stamp component of the first signal to the tertiary signal and the second instrument time stamp component of the tertiary signal. The synchronization provides accurate calculation of a pollutant mass flow rate.
Inventors:
William Martin Sylvis
Sarah Montgomery Kingham
Sarah Montgomery Kingham
Application Number:
JP2015517343A
Publication Date:
June 28, 2017
Filing Date:
June 11, 2013
Export Citation:
Assignee:
Avier Test Systems, Inc.
International Classes:
G01N1/22
Domestic Patent References:
| JP2009103723A | ||||
| JP2007010660A | ||||
| JP2007024730A | ||||
| JP2002350304A | ||||
| JP63308535U | ||||
| JP2002214082A | ||||
| JP62157546A | ||||
| JP11211631A |
Foreign References:
| WO2005028838A1 |
Attorney, Agent or Firm:
Yasuhiko Murayama
Takashi Watanabe
Shinya Mitsuhiro
Takashi Watanabe
Shinya Mitsuhiro
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