Title:
The flow reduction system for isotopic ratio measurement
Document Type and Number:
Japanese Patent JP6282304
Kind Code:
B2
Abstract:
A system for controlling flow of gas in a continuous flow isotope ratio analyser is provided. The system comprises gas inlet and gas outlet lines for providing gas into and from a measuring cell, and at least one switchable flow restriction on the gas inlet line, for selectively controlling gas flow into the isotop ratio analyser. Also provided is a method for determining an isotope ratio using the system according to the invention.
More Like This:
Inventors:
Hans-Jürgen Schulter
Erik Wapelhorst
Nils Stobner
Hans-Jürg Jost
Tim Stortman
Erik Wapelhorst
Nils Stobner
Hans-Jürg Jost
Tim Stortman
Application Number:
JP2016090330A
Publication Date:
February 21, 2018
Filing Date:
April 28, 2016
Export Citation:
Assignee:
Thermo Fisher Scientific (Bremen) Game Behr
International Classes:
G01N1/00; G01N21/05; G01N21/3504; G01N27/62
Domestic Patent References:
| JP2009531677A | ||||
| JP4109542A | ||||
| JP60073336A | ||||
| JP11337525A |
Foreign References:
| WO2014170179A1 | ||||
| CN102928554A |
Other References:
PROSSER, S. J. 外3名,Rapid, Automated Analysis of 13C and 18O of CO2 in Gas Samples by Continuous-flow, Isotope Ratio Mass Spectrometry,BIOLOGICAL MASS SPECTROMETRY,1991年,Vol.20, No.11,P.724-730
Attorney, Agent or Firm:
Takaki Nishijima
Disciple Maru Ken
Shinichiro Tanaka
Mitsuru Matsushita
Ichiro Kurasawa
Yasushi Yamamoto
Disciple Maru Ken
Shinichiro Tanaka
Mitsuru Matsushita
Ichiro Kurasawa
Yasushi Yamamoto
Previous Patent: An image sensor and an imaging device
Next Patent: MONITOR PATTERN FOR MEASURINT THICKNESS OF PLATING FILM
Next Patent: MONITOR PATTERN FOR MEASURINT THICKNESS OF PLATING FILM