Title:
高分子化合物、レジスト材料及びパターン形成方法
Document Type and Number:
Japanese Patent JP4235810
Kind Code:
B2
Abstract:
A polymer comprising recurring units having a partial structure of formula (1) wherein R1 is a single bond or alkylene or fluoroalkylene, R2 and R3 are H or alkyl or fluoroalkyl, at least one of R2 and R3 contains at least one fluorine atom is used as a base resin to formulate a resist composition which has advantages including high transparency to radiation having a wavelength of up to 200 nm, substrate adhesion, developer affinity and dry etching resistance.
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Inventors:
Yuji Harada
Jun Hatakeyama
Yoshio Kawai
Masako Sasako
Masataka Endo
Kishimura Shinji
Kazuhiko Maeda
Haruhiko Komoriya
Kazuhiro Yamanaka
Jun Hatakeyama
Yoshio Kawai
Masako Sasako
Masataka Endo
Kishimura Shinji
Kazuhiko Maeda
Haruhiko Komoriya
Kazuhiro Yamanaka
Application Number:
JP2003363134A
Publication Date:
March 11, 2009
Filing Date:
October 23, 2003
Export Citation:
Assignee:
Shin-Etsu Chemical Co., Ltd.
Panasonic Corporation
Central Glass Co., Ltd.
Panasonic Corporation
Central Glass Co., Ltd.
International Classes:
C08F220/28; C08G61/02; C08F16/26; C08F20/28; C08F32/08; C08F216/14; C08F220/24; C08F232/08; G03C1/10; G03C1/76; G03F7/004; G03F7/039; H01L21/027
Domestic Patent References:
JP2003192733A | ||||
JP2001302728A | ||||
JP2003015301A |
Attorney, Agent or Firm:
Takashi Kojima
Saori Shigematsu
Katsunari Kobayashi
Takeshi Ishikawa
Saori Shigematsu
Katsunari Kobayashi
Takeshi Ishikawa