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Title:
高分子化合物、レジスト材料及びパターン形成方法
Document Type and Number:
Japanese Patent JP4235810
Kind Code:
B2
Abstract:
A polymer comprising recurring units having a partial structure of formula (1) wherein R1 is a single bond or alkylene or fluoroalkylene, R2 and R3 are H or alkyl or fluoroalkyl, at least one of R2 and R3 contains at least one fluorine atom is used as a base resin to formulate a resist composition which has advantages including high transparency to radiation having a wavelength of up to 200 nm, substrate adhesion, developer affinity and dry etching resistance.

Inventors:
Yuji Harada
Jun Hatakeyama
Yoshio Kawai
Masako Sasako
Masataka Endo
Kishimura Shinji
Kazuhiko Maeda
Haruhiko Komoriya
Kazuhiro Yamanaka
Application Number:
JP2003363134A
Publication Date:
March 11, 2009
Filing Date:
October 23, 2003
Export Citation:
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Assignee:
Shin-Etsu Chemical Co., Ltd.
Panasonic Corporation
Central Glass Co., Ltd.
International Classes:
C08F220/28; C08G61/02; C08F16/26; C08F20/28; C08F32/08; C08F216/14; C08F220/24; C08F232/08; G03C1/10; G03C1/76; G03F7/004; G03F7/039; H01L21/027
Domestic Patent References:
JP2003192733A
JP2001302728A
JP2003015301A
Attorney, Agent or Firm:
Takashi Kojima
Saori Shigematsu
Katsunari Kobayashi
Takeshi Ishikawa



 
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