Title:
An image inspection device, a picture inspection method, and a control program of an image inspection device
Document Type and Number:
Japanese Patent JP6241120
Kind Code:
B2
Abstract:
An image inspection apparatus for inspecting an output image on a recording medium by scanning the output image as a scanned image includes an inspection reference image generator to generate an inspection reference image using data of an output-target image; an image inspection unit to determine whether the scanned image includes a defect by comparing a difference between the inspection reference image and the scanned image with a given threshold; and a threshold determiner to determine the given threshold. The threshold determiner computes a difference between the inspection reference image and the scanned image. The threshold determiner determines the given threshold based on the difference between the scanned image and the inspection reference image.
More Like This:
Inventors:
Tadashi Kitai
Tokutaka Masuda
Tokutaka Masuda
Application Number:
JP2013165585A
Publication Date:
December 06, 2017
Filing Date:
August 08, 2013
Export Citation:
Assignee:
株式会社リコー
International Classes:
G01N21/892; G01N21/93; G01N21/956; G03G21/00; G06T1/00
Domestic Patent References:
| JP2012103225A | ||||
| JP2005205797A | ||||
| JP61012345A | ||||
| JP2011122985A | ||||
| JP2010217028A | ||||
| JP9105723A |
Foreign References:
| US5305392 |
Attorney, Agent or Firm:
Takashi Satoru