Title:
An image inspection device, a picture inspection system, and a picture inspection method
Document Type and Number:
Japanese Patent JP6241121
Kind Code:
B2
Abstract:
An image inspection apparatus for inspecting a scanned image of an output image includes an inspection reference image generator to generate an inspection reference image; an image inspection unit to determine a defect by comparing a difference between the inspection reference image and the scanned image with a threshold; a threshold determiner to determine the threshold; and a defect range determiner to determine a range of defect level of a plurality of artificial defects. Based on a difference computed for a defect selected from the plurality of artificial defects, the threshold determiner determines a threshold to be compared with the difference of the selected defect. The defect range determiner conducts a defect determination for the scanned image at the upper and lower limits for a threshold to determine a range of defect level of the plurality of artificial defects.
Inventors:
Hitomi Kaneko
Tadashi Kitai
Tadashi Kitai
Application Number:
JP2013165590A
Publication Date:
December 06, 2017
Filing Date:
August 08, 2013
Export Citation:
Assignee:
株式会社リコー
International Classes:
G01N21/88; G01B11/30; G06T1/00
Domestic Patent References:
| JP2012103225A | ||||
| JP2005205797A | ||||
| JP61012345A | ||||
| JP2010217028A | ||||
| JP2011122985A | ||||
| JP2007212679A |
Foreign References:
| US20060124012 |
Attorney, Agent or Firm:
Takashi Satoru