An instrumentation method and a measuring device - KABUSHIKI KAISHA KOBE SEIKO SHO

Title:

An instrumentation method and a measuring device

Document Type and Number:

Japanese Patent JP5969906

Kind Code:

B2

Abstract:

A measuring unit (301) acquires measurement data for a plurality of lines by repeatedly executing, on a reference tire, a measurement process to acquire measurement data for one line. A first acquisition unit (311) generates height data for one line for each of the plurality of sets of measurement data measured by the measuring unit (301), arranges the generated plurality of values of one-dimensional height data into a matrix form, generates two-dimensional height data for the measured face, and generates reference shape data. A second acquisition unit (314) acquires object one-dimensional height data from one-line shape data measured by the measuring unit (301) for the object tire. The measuring method and measuring device are characterized in that a removal unit (315) compares the object one-dimensional height data and the one-dimensional height data of the reference shape data at the same position in the sub-scan direction for the object one-dimensional height data, and removes, from the object one-dimensional height data, the height component of the projection.

Inventors:

Araki Kaname
Eiji Takahashi

Application Number:

JP2012260595A

Publication Date:

August 17, 2016

Filing Date:

November 29, 2012

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