An integrated circuit and a delay measuring circuit - National University Corporation Chiba University

Title:

An integrated circuit and a delay measuring circuit

Document Type and Number:

Japanese Patent JP6218297

Kind Code:

B2

Inventors:

Ikki Namba
Cui day

Application Number:

JP2016543089A

Publication Date:

October 25, 2017

Filing Date:

March 04, 2016

Export Citation:

Assignee:

National University Corporation Chiba University

International Classes:

G01R31/28; H01L21/822; H01L27/04; H03K5/26

Domestic Patent References:

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