Title:
The ion source for direct sample analysis
Document Type and Number:
Japanese Patent JP6182705
Kind Code:
B2
Abstract:
A Direct Sample Analysis (DSA) ion source system operating at essentially atmospheric pressure is configured to facilitate the ionization, or desorption and ionization, of sample species from a wide variety of gaseous, liquid, and/or solid samples, for chemical analysis by mass spectrometry or other gas phase ion detectors. The DSA system includes one or more means of ionizing samples and includes a sealed enclosure which provides protection from high voltages and hazardous vapors, and in which the local background gas environment may be monitored and well-controlled. The DSA system is configured to accommodate single or multiple samples at any one time, and provide external control of individual sample positioning, sample conditioning, sample heating, positional sensing, and temperature measurement.
Inventors:
White House, Craig M.
Dresh, thomas
Dresh, thomas
Application Number:
JP2014513771A
Publication Date:
August 23, 2017
Filing Date:
June 01, 2012
Export Citation:
Assignee:
PERKINELMER HEALTH SCIENCES INC.
International Classes:
H01J49/10; G01N27/62; H01J49/04; H01J49/06
Domestic Patent References:
| JP2009539114A | ||||
| JP10283982A |
Foreign References:
| US20090294660 | ||||
| US20100096542 |
Attorney, Agent or Firm:
Makoto Onda
Hironobu Onda
Atsushi Honda
Hironobu Onda
Atsushi Honda