ARRAY OBJECT ILLUMINATION DEVICE, ARRAY OBJECT INSPECTION DEVICE AND ARRAY OBJECT INSPECTION LIGHT GUIDE PLATE

Japanese Patent JP2016085171

A

PROBLEM TO BE SOLVED: To provide an array object inspection illumination device that can more uniformly illuminate individual objects in an array object, to provide an array object inspection illumination device that enables a dark field illumination, and to provide an array object inspection light guide plate using the array object inspection illumination device, and to provide an array object inspection light guide plate to be used in the array object inspection illumination device.SOLUTION: An array object inspection illumination device LMa is a device that illuminates an array object SPa having a plurality of prescribed objects provided in an array way, and the device comprises: a light source unit that radiates prescribed light; and a light guide plate 2a upon which the light radiated from the light source unit is incident, and which guides the incident light. The light guide plate 2a comprises an emission unit 21a that crosses a virtual face along a face spreading direction of the light guide plate 2a, and has an emission unit face externally emitting the incident and guided light from the light guide plate 2a. The emission unit 21a is formed respectively above each contour line in a plurality of mutually different compartment areas set up on the light guide plate 2a of a size sufficient to surround the prescribed object.SELECTED DRAWING: Figure 1

KIMURA TOKUO

JP2014219543A

May 19, 2016

October 28, 2014

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KONICA MINOLTA INC

G01N21/84; F21S2/00; F21V7/00; F21V7/04; F21V7/06; F21V7/08; F21V14/00; F21V14/02; F21V19/02; F21V23/00; G02B6/00

Etsushi Kotani
Masataka Otani
Satoshi Sakurai

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