PURPOSE: To provide an IC measuring tester which enables the prevention of a guide member or the like of a socket from being deformed hitting an external lead of ICs when the ICs are set,
CONSTITUTION: This IC measuring tester includes a socket 1 for a measuring handler which is provided with a mold pad 2 having a guide member corresponding to the shape of a mold body 5 of an IC4 to be measured at the periphery part and a measuring element 3 which contacts external leads 6 of the IC4 and an sucking arm 11 to which transfers the IC4 to the mold pad 2 by keeping it sucked and performs a measuring test of the IC4 carried on the mold pad 2 with the sucking arm 11. The guide member is divided corresponding to the external leads 6 of the IC4 and the tip part of the measuring element 3 is inserted into a division.
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OKUTSU MASUMI
IKEDA SHIGEO
