Title:
A malfunction detection device, an abnormality detecting method, and a program
Document Type and Number:
Japanese Patent JP5984449
Kind Code:
B2
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Inventors:
Gyoda Tomoaki
Noriyuki Kushiro
Shigenori Nakata
Masaaki Yabe
Makoto Katsukura
Satoshi Minesawa
Ogawa Yuuki
Noriyuki Kushiro
Shigenori Nakata
Masaaki Yabe
Makoto Katsukura
Satoshi Minesawa
Ogawa Yuuki
Application Number:
JP2012070417A
Publication Date:
September 06, 2016
Filing Date:
March 26, 2012
Export Citation:
Assignee:
Mitsubishi Electric Corporation
International Classes:
G01R22/00; H02J13/00
Domestic Patent References:
| JP2009300367A | ||||
| JP2008112267A | ||||
| JP2002162424A | ||||
| JP2001236582A |
Attorney, Agent or Firm:
Kimura Mitsuru
Koji Yashima
Mie Hideki
Naoki Yamaguchi
Koji Yashima
Mie Hideki
Naoki Yamaguchi