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Title:
コンデンサ装置、電子部品、フィルタ装置、通信装置、およびコンデンサ装置の製造方法
Document Type and Number:
Japanese Patent JP5000660
Kind Code:
B2
Abstract:
The present invention relates to a small, low-height capacitor device in which deterioration of characteristics such as leakage current is reduced. The capacitor device includes a supporting substrate 1; at least one capacitor element 21 disposed on the supporting substrate 1, including a dielectric layer 4 and a pair of electrodes 2 and 5 sandwiching the dielectric layer 4; and a sealant that seals the capacitor element 21 through a space 22. The dielectric layer 4 has an exposed part 23 exposed in the space 22. According to this structure, deterioration of the dielectric layer can be prevented, and a capacitor device exhibiting a good leakage current characteristic is obtained.

Inventors:
Hideharu Kurioka
Hiroshi Katsuta
Yoshihiro Okubo
Application Number:
JP2008537480A
Publication Date:
August 15, 2012
Filing Date:
September 25, 2007
Export Citation:
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Assignee:
Kyocera Corporation
International Classes:
H01G4/12; H01G4/224; H01G4/38; H01G7/06
Domestic Patent References:
JPH04111461A1992-04-13
JP2006196704A2006-07-27
JPS54150665A1979-11-27
JP2005340470A2005-12-08
JP2000357630A2000-12-26
JP2001085272A2001-03-30
JP2005236089A2005-09-02
JPH04209513A1992-07-30
Attorney, Agent or Firm:
Keiichiro Saikyo