Title:
Method for Manufacturing Thin Film Ferroelectric Devices Using Two-Step Temperature Process
Document Type and Number:
Japanese Patent JP6366824
Kind Code:
B2
Abstract:
Methods for producing ferroelectric device are described. A method includes positioning an organic polymeric ferroelectric layer between two conductive materials to form a stack. The stack can be subjected to a 2-step heat treating process. The first heat treating step transforms the organic polymeric ferroelectric precursor to a ferroelectric material having ferroelectric hysteresis properties, and the second heat treating step densities the ferroelectric material to obtain the ferroelectric device. The thin film ferroelectric device can include a thin film ferroelectric capacitor, a thin film ferroelectric transistor, or a thin film ferroelectric diode.
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Inventors:
Park, The, Hoon
Arshalief, Husum, N
Oday, Ihab, N
Can, mode, ray
Arshalief, Husum, N
Oday, Ihab, N
Can, mode, ray
Application Number:
JP2017513515A
Publication Date:
August 01, 2018
Filing Date:
June 04, 2015
Export Citation:
Assignee:
Subic Global Technologies Besloten Fennaught Shap
International Classes:
H01L27/1159; H01G4/14; H01G4/33; H01L37/02; H01L41/09; H01L41/113
Domestic Patent References:
JP2014152238A | ||||
JP56126912A | ||||
JP2011508963A |
Foreign References:
WO2014104345A1 | ||||
WO2010104196A1 |
Attorney, Agent or Firm:
Patent business corporation r&c
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