Title:
【発明の名称】質量分析方法および質量分析装置
Document Type and Number:
Japanese Patent JP3384063
Kind Code:
B2
Abstract:
PURPOSE:To analyze a sample which exists only in a form of extremely small amount by ionizing introduced sample particles by means of a plurality of ion shots, and by separating the masses of the ions thus generated after they are accumulated and blended with each other on an ion trap part. CONSTITUTION:A sample is blended with a matrix which effectively absorbs laser beams, and is applied to the surface of a sample holder 1, and ion is formed in the vicinity of the surface of the holder by radiating laser beams from a pulse laser 3. Voltage is applied to the holder 1, and the ion is introduced into an ion trap 5 through an electrostatic lens 4. Ions are formed several times by radiating a plurality of laser beams which interlock with the slight movement of the holder 1, and the ions are blended with each other by means of the trap 5, and are accumulated. The accumulated ions are emitted from the trap 5 after a fixed period of time after the ion introduction into the ion trap part is completed, and the ion is detected by a detector 6 through an accelerating electrode, and the electrostatic lens, etc., and analysis of a sample which exists in a form of exremely small amount can thus be conducted.
Inventors:
Shu Hirabayashi
Minoru Sakairi
Yasuaki Takada
Minoru Sakairi
Yasuaki Takada
Application Number:
JP30532393A
Publication Date:
March 10, 2003
Filing Date:
December 06, 1993
Export Citation:
Assignee:
株式会社日立製作所
International Classes:
G01N27/62; H01J27/24; H01J49/26; H01J49/40; H01J49/42; (IPC1-7): H01J49/40; G01N27/62; H01J27/24; H01J49/42
Domestic Patent References:
| JP387650A | ||||
| JP62276739A | ||||
| JP486516B1 |
Other References:
Ｓ．Ｍ．Ｍｉｃｈａｅｌ，Ｍ．Ｃｈｉｅｎ，ａｎｄＤ．Ｍ．Ｌｕｂｍａｎ，Ａｎ ｉｏｎ ｔｒａｐ ｓｔｏｒａｇｅ／ｔｉｍｅ−ｏｆ−ｆｌｉｇｈｔｍａｓｓ ｓｐｅｃｔｒｏｍｅｔｅｒ，Ｒｅｖ．Ｓｃｉ．Ｉｎｓｔｒｕｍ，米国，Ａｍｅｒｉｃａｎ Ｉｎｓｔｒｉｔｕｔｅ ｏｆ Ｐｈｙｓｉｃｓ，１９９２年１０月，Ｖｏｌ６３，Ｎｏ．１０，Ｐａｒｔ１，４２７７−４２８４
Attorney, Agent or Firm:
Masayuki Watanabe (1 person outside)