Title:
A measurement parameter setup control device and the measurement parameter setup control method
Document Type and Number:
Japanese Patent JP6043560
Kind Code:
B2
Abstract:
PROBLEM TO BE SOLVED: To provide a measurement parameter setting controller and a measurement parameter setting control method which allow for simplification of the setting work, by matching the measurement parameters according to an error detection system including a plurality of measurement channels.SOLUTION: A measurement parameter setting controller includes measurement channel selection means for acquiring the first measurement parameters of a plurality of measurement channels that have been set already in a set apparatus having a plurality of measurement channels, and then selecting any one measurement channel. When second measurement parameters are set, by measurement parameter setting means, in a measurement channel selected by the measurement channel selection means, the first measurement parameters of a plurality of other measurement channels not selected by the measurement channel selection means are rewritten to the same measurement parameters as the second measurement parameters of a measurement channel selected by the measurement channel selection means.
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Inventors:
Taketo Saito
Application Number:
JP2012211996A
Publication Date:
December 14, 2016
Filing Date:
September 26, 2012
Export Citation:
Assignee:
Anritsu Co., Ltd.
International Classes:
H04L1/00; G01R23/16; H04L69/40
Domestic Patent References:
| JP8335124A | ||||
| JP2012028883A | ||||
| JP2011158473A |
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