The measurement system, the measuring method, measuring device, and lamination structure of the optical characteristic of application material

Title:

The measurement system, the measuring method, measuring device, and lamination structure of the optical characteristic of application material

Document Type and Number:

Japanese Patent JP6097714

Kind Code:

B2

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Inventors:

Eriko Ikeda
Takeharu Tani

Application Number:

JP2014069560A

Publication Date:

March 15, 2017

Filing Date:

March 28, 2014

Export Citation:

Assignee:

FUJIFILM Corporation

International Classes:

G01N21/27; A61B5/00

Domestic Patent References:

JP2013145191A
JP2007278880A

Foreign References:

Attorney, Agent or Firm:

Nozomi Watanabe
Haruko Sanwa
Hideaki Ito
Fumio Mitsuhashi

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