Title:
A measuring device and a measuring method
Document Type and Number:
Japanese Patent JP5946193
Kind Code:
B2
Abstract:
Light emitted from a low-coherence light source (10) is split into two beams by an optical coupler (20). One of the two beams split by the optical coupler (20) is applied to a sample medium (40). The other of the two beams split by the optical coupler (20) is subjected to phase modulation by a reference mirror (50) and a vibration element (52). The beam (reference beam) subjected to phase modulation and a scattered beam from the sample medium (40) are wavelength-resolved by a diffraction grating (62), and the spectrum of interference light of the reference beam and the scattered beam is detected by a photodetector (70). A calculation section (80) calculates an intensity signal corresponding to the position of each scattering point in the sample medium (40) on the basis of the detected spectrum, calculates a power spectrum corresponding to the position of each scattering point on the basis of a temporal change in the intensity signal corresponding to the position of each scattering point, and calculates a diffusion coefficient of the particles corresponding to the position of each scattering point on the basis of the calculated power spectrum.
Inventors:
Toshiaki Iwai
Toshiharu Watanabe
Toshiharu Watanabe
Application Number:
JP2013545857A
Publication Date:
July 05, 2016
Filing Date:
October 24, 2012
Export Citation:
Assignee:
National University Corporation Tokyo University of Agriculture and Technology
International Classes:
G01N21/17; G01N21/49
Domestic Patent References:
| JP2005121600A | ||||
| JP200365930A | ||||
| JP2007198804A |
Attorney, Agent or Firm:
Mitsue Obuchi
Yukio Fuse
Yukio Fuse