Title:
A measuring method and a device of anesthetic depth
Document Type and Number:
Japanese Patent JP6259471
Kind Code:
B2
Abstract:
The present invention rapidly reacts to changes in the degree of anesthesia to provide an accurate and timely anesthetic depth measurement result, and a method for measuring anesthetic depth comprises the steps of: an epoch dividing portion generating an epoch signal by dividing a EEG signal into a plurality of numbers based on time units, a coefficient portion extracting a CAI calculation value (CAI) by calculating the number of points in an epoch having a value higher than an established critical value, a Shannon entropy calculating portion extracting a Shannon entropy calculation value (ShEn) by conducting a Shannon entropy-calculation from the EEG signal, and a spectra entropy calculating portion extracting a spectra entropy value (SpEn) by conducting a spectra entropy calculation; an improved Shannon entropy extracting portion extracting an improved Shannon entropy calculation value (MshEn) by multiplying the Shannon entropy calculation value (ShEn) and the spectra entropy calculation value (SpEn); and a CAI extracting portion extracting an anesthetic depth index (MsCAI) through logical operating of the improved Shannon entropy calculation value(MshEn) and the CAI calculation value (CAI).
Inventors:
Chang Ho Jung
Kim Eun Fee
Park Sang Hyun
Hong Seung Kyun
Kim Guam
Kim Eun Fee
Park Sang Hyun
Hong Seung Kyun
Kim Guam
Application Number:
JP2015555929A
Publication Date:
January 10, 2018
Filing Date:
February 13, 2014
Export Citation:
Assignee:
Cham Engineering Company Limited
International Classes:
A61B5/374
Domestic Patent References:
| JP9271516A | ||||
| JP61090639A | ||||
| JP2003175105A | ||||
| JP2006255134A |
Attorney, Agent or Firm:
Maeda patent office