A measuring method of a device under test - MURATA MANUFACTURING CO.,LTD.

Title:

A measuring method of a device under test

Document Type and Number:

Japanese Patent JP5914474

Kind Code:

B2

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Inventors:

Takashi Kondo
Seiji Kaminami
Yuichi Ogawa
Sakura Tomita

Application Number:

JP2013517918A

Publication Date:

May 11, 2016

Filing Date:

April 09, 2012

Export Citation:

Assignee:

MURATA MANUFACTURING CO.,LTD.

International Classes:

G01N21/35; G01N21/01; G01N21/3586

Domestic Patent References:

JP5322746A
JP200919925A

Attorney, Agent or Firm:

Fukami patent office

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