Title:
A measuring method using the measurement system using a dielectric part photosensor and a dielectric part photosensor, and a dielectric part photosensor
Document Type and Number:
Japanese Patent JP6169546
Kind Code:
B2
Abstract:
PROBLEM TO BE SOLVED: To improve measurement reproducibility and measurement accuracy in component concentration measurements using a dielectric spectroscopic sensor and an electromagnetic wave.SOLUTION: A dielectric spectroscopic sensor 1 has a first metal wire 101 on a first face 110a of a dielectric substrate 110, and a second metal wire 102 axisymmetric with respect to the first metal wire 101 on a second face 110b of the dielectric substrate 110. A measurement sample 100 is disposed on the first face 110a.SELECTED DRAWING: Figure 1
Inventors:
Tajima Takuro
Masato Nakamura
Hiroyoshi Toko
Akihiko Hirata
Masato Nakamura
Hiroyoshi Toko
Akihiko Hirata
Application Number:
JP2014185139A
Publication Date:
July 26, 2017
Filing Date:
September 11, 2014
Export Citation:
Assignee:
Nippon Telegraph and Telephone Corporation
International Classes:
G01N21/3581; G01N21/3586
Domestic Patent References:
| JP2013024639A | ||||
| JP2006138842A | ||||
| JP2010236868A | ||||
| JP2013501917A | ||||
| JP2007501391A |
Foreign References:
| WO2012132111A1 |
Other References:
CAO,W et al.,Low-loss ultra-high-Q dark mode plasmonic Fano metamaterials,OPTICS LETTERS,2012年 8月15日,Vol.37,No.16
Attorney, Agent or Firm:
Hidekazu Miyoshi
Rie Kudo
Rie Kudo