A method of detecting the abnormalities of measurement data, and a malfunction detection device of measurement data

Title:

A method of detecting the abnormalities of measurement data, and a malfunction detection device of measurement data

Document Type and Number:

Japanese Patent JP5953089

Kind Code:

B2

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Inventors:

Osamu Sakamoto
Satoshi Takeshita
Akio Tajima
Tadanobu Okubo
Enomoto Tomonori

Application Number:

JP2012082594A

Publication Date:

July 13, 2016

Filing Date:

March 30, 2012

Export Citation:

Assignee:

Lsi Medience Co., Ltd.

International Classes:

G01N35/00

Domestic Patent References:

Foreign References:

WO2012008324A1

Attorney, Agent or Firm:

Yoshiyuki Kawaguchi
Hidemi Matsukura
Shinichi Sanuki
Takeshi Niwa
Kaoru Kosaka

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