Title:
波面センサおよびいくつかの光ビームの間に存在するピストンおよびチルトの差を決定するための方法
Document Type and Number:
Japanese Patent JP6513811
Kind Code:
B2
Abstract:
A wavefront analyzer is modified to simply determine the differences in amplitude and tilt which can exist between the different regions of an initial wavefront (S0). To achieve this, interference between two waves only is produced from beams (F1, F2) which come from neighboring regions on the initial wavefront. Such an analyzer can be used to coherently combine laser radiation produced by different sources arranged in parallel. Another use is for the determination of the differences in height and inclination which exist between the neighboring mirror segments of a Keck telescope.
Inventors:
Blanche, Sandy
Depres, Maxim
Lombard, Lorraine
Primo, jerome
Depres, Maxim
Lombard, Lorraine
Primo, jerome
Application Number:
JP2017535129A
Publication Date:
May 15, 2019
Filing Date:
September 18, 2015
Export Citation:
Assignee:
Onera (Office Nacional de Chudue de Le Cherche Aerospatiale)
International Classes:
G01J9/02; G01B9/02
Domestic Patent References:
| JP2005345260A | ||||
| JP4124647U | ||||
| JP7198352A | ||||
| JP2009526984A | ||||
| JP2012511728A |
Foreign References:
| US7106457 | ||||
| US5080490 | ||||
| US5220406 | ||||
| US20090051928 | ||||
| US20100141959 |
Other References:
C. Bellanmger et al.,Collective phase measurement of an array of fiber lasers by quadriwave lateral shearing interferometry for coherent beam combining,Optics Letters,2010年12月,vol. 35, No. 23,pp. 3931-3933
Attorney, Agent or Firm:
Harakenzo world patent & trademark